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Small Test Handler "TH281"

SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.

The 『TH281』 is a compact test handler designed for room temperature/high temperature measurements compatible with devices such as SOP, SSOP, and TSSOP. It features a structure that allows for docking with large test heads and is compatible with various sockets including standard sockets, high-frequency sockets, and flat contacts. Additionally, each component has been modularized to achieve quick changeover between different types. 【Features】 ■ High throughput, low jam rate, space-saving ■ Large-capacity loader and unloader suitable for mass production ■ Structure compatible with docking large test heads ■ Modularized components for quick changeover ■ Compatible with various sockets *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
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  • Small Test Handler

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